TY

Toshikazu Yasuye

HI Hitachi: 1 patents #311 of 1,214Top 30%
Overall (1982): #80,649 of 81,411Top 100%
1
Patents 1982

Issued Patents 1982

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4345312 Method and device for inspecting the defect of a pattern represented on an article Seiji Kashioka, Yoshihiro Shima 1982-08-17