Issued Patents 1982
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4345312 | Method and device for inspecting the defect of a pattern represented on an article | Toshikazu Yasuye, Yoshihiro Shima | 1982-08-17 |
| 4334241 | Pattern position detecting system | Yoshihiro Shima, Takafumi Miyatake | 1982-06-08 |