Issued Patents All Time
Showing 126–141 of 141 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7406151 | X-ray microscope with microfocus source and Wolter condenser | Wenbing Yun, Michael Feser, Frederick W. Duewer | 2008-07-29 |
| 7400704 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source | Wenbing Yun, David Dean Scott, David R. Trapp, Frederick W. Duewer | 2008-07-15 |
| 7394890 | Optimized x-ray energy for high resolution imaging of integrated circuits structures | Wenbing Yun, Frederick W. Duewer | 2008-07-01 |
| 7388942 | X-ray micro-tomography system optimized for high resolution, throughput, image quality | Wenbing Yun, David Dean Scott | 2008-06-17 |
| 7365909 | Fabrication methods for micro compounds optics | Wenbing Yun, Michael Feser, Alan Francis Lyon | 2008-04-29 |
| 7297959 | Lens bonded X-ray scintillator system and manufacturing method therefor | Wenbing Yun, David R. Trapp | 2007-11-20 |
| 7286640 | Dual-band detector system for x-ray imaging of biological samples | Wenbing Yun, David Dean Scott | 2007-10-23 |
| 7268945 | Short wavelength metrology imaging system | Wenbing Yun | 2007-09-11 |
| 7215736 | X-ray micro-tomography system optimized for high resolution, throughput, image quality | Wenbing Yun, David Dean Scott | 2007-05-08 |
| 7170969 | X-ray microscope capillary condenser system | Wenbing Yun, Frederick W. Duewer | 2007-01-30 |
| 7130375 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source | Wenbing Yun, David Dean Scott, David R. Trapp, Frederick W. Duewer | 2006-10-31 |
| 7119953 | Phase contrast microscope for short wavelength radiation and imaging method | Wenbing Yun | 2006-10-10 |
| 7057187 | Scintillator optical system and method of manufacture | Wenbing Yun, David R. Trapp | 2006-06-06 |
| 6917472 | Achromatic fresnel optics for ultraviolet and x-ray radiation | Wenbing Yun | 2005-07-12 |
| 6914723 | Reflective lithography mask inspection tool based on achromatic Fresnel optics | Wenbing Yun | 2005-07-05 |
| 6885503 | Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations | Wenbing Yun, Kenneth W. Nill | 2005-04-26 |