Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4791356 | In-circuit testing system | Harvey B. Crisler, Robert G. Jacobson, Chang Hwan Kim, Edward C. Llewellyn | 1988-12-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4791356 | In-circuit testing system | Harvey B. Crisler, Robert G. Jacobson, Chang Hwan Kim, Edward C. Llewellyn | 1988-12-13 |