Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188818 | Spectrometer, metrology system, and semiconductor inspection method | Jinyong Kim | 2025-01-07 |
| 5300257 | 4,4'-biphenylenediphosphonite compound and use thereof | Hiroyuki Akashi, Takeshi Inoue, Tetsuji Ike, Shoichi Horie | 1994-04-05 |