Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11885741 | Analysis device, liquefied gas production plant, and property analysis method | Ryota Sakai, Hideko Tanaka, Toshiki Ohara | 2024-01-30 |
| 11340159 | Measurement device, calibration curve generation system, spectrum measurement method, calibration curve generation method, analysis device, liquefied gas production plant, and property analysis method | Ryota Sakai, Hideko Tanaka, Toshiki Ohara | 2022-05-24 |