Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9194823 | Radiation inspection apparatus | Hirohiko Obinata | 2015-11-24 |
| 9170194 | Material property measuring apparatus | Yasushi Ichizawa, Kazuki Setsuda, Naomichi Chida | 2015-10-27 |
| 8547544 | Multichannel photometric measurement apparatus | Yasushi Ichizawa, Shigeyuki Kakuta, Kazufumi Nishida | 2013-10-01 |