Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7154292 | Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same | — | 2006-12-26 |
| 7064572 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2006-06-20 |
| 7053645 | System and method for detecting defects in a thin-film-transistor array | — | 2006-05-30 |
| 7042244 | Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same | — | 2006-05-09 |
| 7024338 | System and method for improving TFT-array manufacturing yields | — | 2006-04-04 |
| 6996446 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2006-02-07 |
| 6982556 | System and method for classifying defects in and identifying process problems for an electrical circuit | — | 2006-01-03 |
| 6960927 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2005-11-01 |
| 6949944 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2005-09-27 |
| 6888368 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2005-05-03 |
| 6862489 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2005-03-01 |
| 6850086 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process | — | 2005-02-01 |