Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
KC

Kyo Chung — 12 Patents

YTYieldboost Tech: 12 patents #1 of 1Top 100%
San Jose, CA: #5,425 of 32,062 inventorsTop 20%
California: #51,404 of 386,348 inventorsTop 15%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Kyo Chung has been granted 12 US patents while listed as an inventor at Yieldboost Tech. The first was granted in 2005 and the most recent in December 2006. Kyo Chung ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Kyo Chung in San Jose, CA, US.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
7154292 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same 2006-12-26
7064572 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2006-06-20
7053645 System and method for detecting defects in a thin-film-transistor array 2006-05-30
7042244 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same 2006-05-09
7024338 System and method for improving TFT-array manufacturing yields 2006-04-04
6996446 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2006-02-07
6982556 System and method for classifying defects in and identifying process problems for an electrical circuit 2006-01-03
6960927 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2005-11-01
6949944 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2005-09-27
6888368 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2005-05-03
6862489 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2005-03-01
6850086 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process 2005-02-01