ZX

Zhiliang Xia

YC Yangtze Memory Technologies Co.: 153 patents #1 of 626Top 1%
Samsung: 9 patents #14,526 of 75,807Top 20%
Overall (All Time): #5,229 of 4,157,543Top 1%
162
Patents All Time

Issued Patents All Time

Showing 151–162 of 162 patents

Patent #TitleCo-InventorsDate
10714492 Methods for forming multi-division staircase structure of three-dimensional memory device Wenyu Hua, Zhong Zhang 2020-07-14
10680009 Method for forming gate structure of three-dimensional memory device Qiang Xu, Ming SHAO, Zongliang Huo 2020-06-09
10651192 Word line structure of three-dimensional memory device Qiang Xu, Fandong Liu, Zongliang Huo, Yaohua Yang, Peizhen Hong +2 more 2020-05-12
10522561 Method for forming a three-dimensional memory device Kun Zhang, Fandong Liu 2019-12-31
10510415 Memory device using comb-like routing structure for reduced metal line loading Zongliang Huo, Jun Liu, Li Xiao 2019-12-17
10249636 Vertical memory devices and methods of manufacturing the same Jang-Gn Yun, Ahn-Sik Moon, Se-jun Park, Joon-Sung Lim, Sung-Min Hwang 2019-04-02
10217205 Grain analyzing method and system using HRTEM image Min Chul Park, Dae Sin Kim, Sat Byul Kim, Sae-jin Kim, Je Hyun Lee 2019-02-26
9859296 Semiconductor devices including a conductive pattern contacting a channel pattern and methods of manufacturing the same Se-jun Park, Jang-Gn Yun, Sung-Min Hwang, Ahn-Sik Moon 2018-01-02
9853045 Semiconductor device having channel holes Sung-Min Hwang, Jang-Gn Yun, Ahn-Sik Moon, Se-jun Park, Joon-Sung Lim 2017-12-26
9786676 Vertical memory devices and methods of manufacturing the same Jang-Gn Yun, Ahn-Sik Moon, Se-jun Park, Joon-Sung Lim, Sung-Min Hwang 2017-10-10
9786675 Non-volatile memory devices including charge storage layers Jaehun Jung, Daewoong Kang, Dae Sin Kim, Kwang Soo Seol, Homin Son +1 more 2017-10-10
9099203 Method for testing retention characteristics of semiconductor device having a volatile device cell and semiconductor test apparatus Chiho KIM, Sung-hee Lee, Nara Kim, Dae Sin Kim 2015-08-04