SN

Sheng Nie

YC Yangtze Memory Technologies Co.: 1 patents #419 of 626Top 70%
Overall (All Time): #2,824,503 of 4,157,543Top 70%
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Patent #TitleCo-InventorsDate
10823683 Method for detecting defects in deep features with laser enhanced electron tunneling effect Jin Xing Chen, Junqi REN 2020-11-03