JT

Jinyu Tong

YC Yangtze Memory Technologies Co.: 1 patents #419 of 626Top 70%
Overall (All Time): #2,498,507 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
11982709 Methods and structures for semiconductor device testing Lin Qi, Xiaoqiong Du, Juan Wang 2024-05-14