Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7275436 | Method and apparatus for measuring film thickness and film thickness growth | — | 2007-10-02 |
| 7218215 | Cargo container integrity system | Robert A. Salisbury, Christopher M. Smolen, William S. Pantle | 2007-05-15 |
| 7176474 | Method and apparatus for measuring and monitoring coatings | — | 2007-02-13 |
| 7122944 | Signal generation system and method for generating signals | — | 2006-10-17 |
| 6820485 | Method and apparatus for measuring film thickness and film thickness growth | — | 2004-11-23 |
| 4637869 | Dual ion beam deposition of amorphous semiconductor films | David A. Glocker, John R. Miller, Henry Windischmann | 1987-01-20 |
| 4416755 | Apparatus and method for producing semiconducting films | Gerald P. Ceasar | 1983-11-22 |
| 4376688 | Method for producing semiconductor films | Gerald P. Ceasar | 1983-03-15 |