Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12046787 | Waveguide connector for connecting first and second waveguides, where the connector includes a male part, a female part and a self-alignment feature and a test system formed therefrom | — | 2024-07-23 |
| 11855376 | Coaxial contact having an open-curve shape | — | 2023-12-26 |
| 11604219 | Automatic test equipement having fiber optic connections to remote servers | Daniel L. Engel, Leal J. Daniels | 2023-03-14 |
| 10972192 | Handler change kit for a test system | Brian C. Wadell, Jonathan Hanes Williams | 2021-04-06 |
| 10451652 | Coaxial structure for transmission of signals in test equipment | David Walter Lewinnek, Luis Antonio Valiente | 2019-10-22 |
| 10060475 | Braking system | Gary Fowler, Vladimir Vayner, Michael Peter Hascher, Andreas Flieher | 2018-08-28 |
| 9786977 | Pocketed circuit board | Timothy Daniel Lyons, Frank Parrish, Brian G. Donovan, Vladimir Vayner, Brandon E. Creager +1 more | 2017-10-10 |
| 9594114 | Structure for transmitting signals in an application space between a device under test and test electronics | — | 2017-03-14 |
| 9435855 | Interconnect for transmitting signals between a device and a tester | David Walter Lewinnek, Luis Antonio Valiente, Craig Anthony DiPalo | 2016-09-06 |
| 7358754 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment | D. Evan Williams | 2008-04-15 |
| 7295024 | Contact signal blocks for transmission of high-speed signals | — | 2007-11-13 |
| 7078890 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment | D. Evan Williams | 2006-07-18 |
| 6963211 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment | D. Evan Williams | 2005-11-08 |
| 6888427 | Flex-circuit-based high speed transmission line | Vladan Temer | 2005-05-03 |
| 6833696 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment | D. Evan Williams | 2004-12-21 |
| 6166553 | Prober-tester electrical interface for semiconductor test | — | 2000-12-26 |
| 6107813 | Probe card changer system and method | Tom Richards | 2000-08-22 |
| 6027346 | Membrane-supported contactor for semiconductor test | Vladan Temer, Dave Teglia | 2000-02-22 |
| 5528158 | Probe card changer system and method | Tom Richards | 1996-06-18 |
| 5471148 | Probe card changer system and method | James C. Anderson | 1995-11-28 |