Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7944561 | Measuring an appearance property of a surface using a bidirectional reflectance distribution function | Jon Nisper, Patrick S. Rood, Brett Pawlanta, Thomas Mark Richardson | 2011-05-17 |
| 7940396 | Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function | Jon Nisper, Patrick S. Rood, Brett Pawlanta, Thomas Mark Richardson | 2011-05-10 |