Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11705457 | Monolithic multi-FETS | Ronald S. Cok | 2023-07-18 |
| 11670602 | Secure integrated-circuit systems | Ronald S. Cok | 2023-06-06 |
| 11469259 | Printable device wafers with sacrificial layers | Christopher Bower, Etienne Menard, Matthew Meitl | 2022-10-11 |
| 11322460 | Secure integrated-circuit systems | Ronald S. Cok | 2022-05-03 |
| 11251139 | Secure integrated-circuit systems | Ronald S. Cok | 2022-02-15 |
| 11237522 | Dial clock with counter-rotating indicators | — | 2022-02-01 |
| 11152395 | Monolithic multi-FETs | Ronald S. Cok | 2021-10-19 |
| 10943931 | Wafers with etchable sacrificial patterns, anchors, tethers, and printable devices | Christopher Bower, Etienne Menard, Matthew Meitl | 2021-03-09 |
| 10522575 | Methods of making printable device wafers with sacrificial layers | Christopher Bower, Etienne Menard, Matthew Meitl | 2019-12-31 |
| 10163945 | Printable device wafers with sacrificial layers | Christopher Bower, Etienne Menard, Matthew Meitl | 2018-12-25 |
| 10027181 | Layers of safety and failsafe capability for operation of class IV laser in consumer electronics devices | Brent Fisher, Brian J. Cox, Matthew Meitl, Scott Burroughs | 2018-07-17 |
| 9899432 | Printable device wafers with sacrificial layers gaps | Christopher Bower, Etienne Menard, Matthew Meitl | 2018-02-20 |
| 9496155 | Methods of selectively transferring active components | Etienne Menard | 2016-11-15 |
| 9443883 | Methods of forming printable integrated circuit devices and devices formed thereby | Christopher Bower, Etienne Menard, Matthew Meitl | 2016-09-13 |
| 9401344 | Substrates with transferable chiplets | Christopher Bower | 2016-07-26 |
| 9040425 | Methods of forming printable integrated circuit devices and devices formed thereby | Christopher Bower, Etienne Menard, Matthew Meitl | 2015-05-26 |
| 8934259 | Substrates with transferable chiplets | Christopher Bower | 2015-01-13 |
| 7589465 | Getter material | — | 2009-09-15 |
| 5532817 | Method of optical inspection | Robert A. DeVries, Reed A. Shick, G. Thomas Wells | 1996-07-02 |