Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372078 | Detecting thickness variation and quantitative depth utilizing scanning electron microscopy with a surface profiler | Sean P. Leary | 2016-06-21 |
| 9293157 | Automated active feedback slice and view milling of magnetic head cross-sections | Sataporn Sittisak | 2016-03-22 |
| 8624184 | Methods for spatially resolved alignment of independent spectroscopic data from scanning transmission electron microscopes | Guilherme Parente Souza | 2014-01-07 |