Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8097846 | Metrology and 3D reconstruction of devices in a wafer | Lei Wang, Chester Xiaowen Chien | 2012-01-17 |
| 8074345 | Method of measuring a bevel angle in a write head | Donghong Li | 2011-12-13 |