Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10281491 | Probe card for testing semiconductor wafers | Raul Molina, Michael Chrastecky | 2019-05-07 |
| 8717056 | Probing assembly for testing integrated circuits | — | 2014-05-06 |
| 8264248 | Micro probe assembly | — | 2012-09-11 |
| 7282934 | Flexible microcircuit space transformer assembly | Dean C. Mazza, Salvatore Sanzari, Jeff P. Ritell | 2007-10-16 |
| 6977515 | Method for forming photo-defined micro electrical contacts | Charles L. Barto, Phillip M. Truckle | 2005-12-20 |
| 6906540 | Method for chemically etching photo-defined micro electrical contacts | Charles L. Barto | 2005-06-14 |
| 6661244 | Nickel alloy probe card frame laminate | Zbigniew Kukielka, William F. Thiessen, Stephen Evans | 2003-12-09 |
| 6633175 | Temperature compensated vertical pin probing device | Stephen Evans | 2003-10-14 |
| 6566898 | Temperature compensated vertical pin probing device | William F. Theissen, Stephen Evans, Zbigniew Kukielka | 2003-05-20 |
| 6297657 | Temperature compensated vertical pin probing device | William F. Thiessen | 2001-10-02 |
| 6160412 | Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment | Anthony Paul Martel | 2000-12-12 |
| 5416429 | Probe assembly for testing integrated circuits | Jack R. Lander | 1995-05-16 |