Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8377578 | Infrared reflecting layer system for transparent substrate | Christoph Koeckert, Falk Milde | 2013-02-19 |
| 8259294 | Method and device for measuring optical characteristic variables of transparent, scattering measurement objects | Thomas Knoth, Tina Schoessler, Martin Dimer | 2012-09-04 |
| 8119194 | Infrared reflecting layer system for transparent substrate | Christoph Koekert, Falk Milde | 2012-02-21 |
| 8072607 | Measuring device for measuring optical properties of transparent substrates | Jochen Krause | 2011-12-06 |
| 7443518 | Measuring instrument, in particular for transmission measurement in vacuum system | Jochen Krause | 2008-10-28 |