Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6784000 | Method for measurement of electromigration in semiconductor integrated circuits | Robert Sikora, Gedaliahoo Kreiger | 2004-08-31 |
| 5097449 | Non-volatile memory structure | — | 1992-03-17 |
| 5047816 | Self-aligned dual-gate transistor | — | 1991-09-10 |