Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5371748 | Technique and apparatus for testing an electrically programmable ROM embedded among other digital circuitry on an IC chip | Beng I. Saw, Dai Le | 1994-12-06 |
| 5345450 | Method of compressing and decompressing simulation data for generating a test program for testing a logic device | Beng I. Saw, Dai Le | 1994-09-06 |