Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5493926 | Method of identifying a weakest interface where delamination is most likely to occur in a multi-layer dielectric film stack | Landon B. Vines, Felix Fujishiro, Danny Echtle | 1996-02-27 |