Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4872052 | Semiconductor device inspection system | Ralph M. Weisner, Takashi Kamiharako, Iwami Uramoto | 1989-10-03 |
| 4736437 | High speed pattern recognizer | Jack M. Sacks, Gary L. DeZotell, Richard DeKlotz | 1988-04-05 |