Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816476 | XPS and Raman sample analysis system and method | Timothy Sion Nunney, Matthew Wayne Meyer, Noah Hibbard | 2020-10-27 |
| 8164066 | Magnetic lens, method for focusing charged particles and charged particle energy analyzer | Bryan Barnard | 2012-04-24 |