Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10032602 | Method for imaging wafer with focused charged particle beam in semiconductor fabrication | — | 2018-07-24 |
| 6251782 | Specimen preparation by focused ion beam technique | Angela Y. C. Lee | 2001-06-26 |
| 5910678 | Raised fuse structure for laser repair | Yung-Song Lou, Ching-Cherng Rou, Chao-Ming Koh, Shin-Chi Lee, Chuen-Nan Chen | 1999-06-08 |
| 5729042 | Raised fuse structure for laser repair | Yung-Song Lou, Ching-Cherng Rou, Chao-Ming Koh, Shin-Chi Lee, Chuen-Nan Chen | 1998-03-17 |