Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10371668 | Apparatus and methods for probing a material as a function of depth using depth-dependent second harmonic generation | Joy Garnett, Halina Krzyzanowska | 2019-08-06 |
| 7158284 | Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures | Michael Alles, Bongim Jun, Robert Pasternak, Ron Schrimpf, Sorin Cristoloveanu | 2007-01-02 |
| 6856159 | Contactless optical probe for use in semiconductor processing metrology | Gunter Leupke, Wei Wang | 2005-02-15 |
| 4775789 | Method and apparatus for producing neutral atomic and molecular beams | Royal G. Albridge, Jr., Richard F. Haglund, Kenneth James Snowdon | 1988-10-04 |
| 4393311 | Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles | Leonard C. Feldman, Joseph S. Kraus, Morton M. Traum, John Tully | 1983-07-12 |