Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10746664 | Imaging apparatus for obtaining image of polarizing film, inspection apparatus, and inspection method | Shunsuke Sasaki, Ichiro Suehiro, Shuhei Shibata, David Ignacio Serrano Garcia | 2020-08-18 |
| 9612449 | Axially symmetric polarization conversion element | Toshitaka Wakayama, Toru Yoshizawa | 2017-04-04 |
| 8107075 | Optical characteristic measuring apparatus and optical characteristics measuring method | Toshitaka Wakayama | 2012-01-31 |
| 7796257 | Measuring apparatus, measuring method, and characteristic measurement unit | Kazuhiko Oka, Toshitaka Wakayama, Atsushi Taniguchi | 2010-09-14 |
| 6906809 | Surface shape measuring system | Hisatoshi Fujiwara, Toru Yoshizawa | 2005-06-14 |
| 6665059 | Method of measuring an inner stress state of disk substrate | Toshiyuki Kanno, Eiji Ishibashi, Toru Yoshizawa | 2003-12-16 |
| 5375009 | Optical isolator device having a wider cutoff wavelength band for a return light beam | Kenichi Koike | 1994-12-20 |