Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11017259 | Defect inspection method, defect inspection device and defect inspection system | Arulmurugan Ambikapathi, Ming-Tang Hsu, Chia-Liang Lu | 2021-05-25 |
| 10991088 | Defect inspection system and method using artificial intelligence | Arulmurugan Ambikapathi, Ming-Tang Hsu, Chia-Liang Lu | 2021-04-27 |
| 10964004 | Automated optical inspection method using deep learning and apparatus, computer program for performing the method, computer-readable storage medium storing the computer program, and deep learning system thereof | Chia-Liang Lu, Ming-Tang Hsu, Arulmurugan Ambikapathi, Chien-Chung Lin | 2021-03-30 |
| 10763148 | Semiconductor defects inspection apparatus | Chien-Wen Huang, Po-Tsung Lin | 2020-09-01 |
| 9378409 | Eye searching method and eye state detection apparatus and eye searching apparatus using the same | Chia-Chun Tsou, Po-Tsung Lin | 2016-06-28 |
| 9354615 | Device, operating method and computer-readable recording medium for generating a signal by detecting facial movement | Po-Tsung Lin, Chia-Chun Tsou | 2016-05-31 |