Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5195117 | Method for using secondary radiation scattering to evaluate the thickness of materials | — | 1993-03-16 |
| 4521808 | Electrostatic imaging apparatus | Alfonso Zermeno, Lee M. Marsh, Jr., James M. Hevezi, Ronald W. Cowart | 1985-06-04 |
| 4446365 | Electrostatic imaging method | Alfonso Zermeno, Lee M. Marsh, Jr., James M. Hevezi | 1984-05-01 |
| 4363969 | Light switched segmented tomography detector | — | 1982-12-14 |