DF

David P. Fries

UF University Of South Florida: 36 patents #6 of 1,794Top 1%
UE US Dept of Energy: 2 patents #577 of 5,099Top 15%
EN Endgate: 1 patents #11 of 19Top 60%
HS Halliburton Energy Services: 1 patents #2,863 of 4,711Top 65%
UF University of Florida Foundation: 1 patents #311 of 807Top 40%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
📍 Leesburg, VA: #6 of 496 inventorsTop 2%
🗺 Virginia: #357 of 34,511 inventorsTop 2%
Overall (All Time): #70,734 of 4,157,543Top 2%
43
Patents All Time

Issued Patents All Time

Showing 26–43 of 43 patents

Patent #TitleCo-InventorsDate
7386289 Microwireless integrated environmental sensor and transmitter system Thomas Weller, Thomas Ketterl 2008-06-10
7271877 Method and apparatus for maskless photolithography 2007-09-18
7259566 Micro sensor system for liquid conductivity, temperature and depth Heather Broadbent, George Steimle, Stanislav Ivanov 2007-08-21
7186989 Low thermal mass fluorometer Andrew Alan Farmer, Bill Flanery 2007-03-06
7113104 Giant magnetoresistance based gyroscope 2006-09-26
7095484 Method and apparatus for maskless photolithography 2006-08-22
7049049 Maskless photolithography for using photoreactive agents 2006-05-23
6998219 Maskless photolithography for etching and deposition 2006-02-14
6940277 Giant magnetoresistance based nanopositioner encoder 2005-09-06
6764796 Maskless photolithography using plasma displays 2004-07-20
6744045 Portable underwater mass spectrometer Robert T. Short, Robert H. Byrne 2004-06-01
6727498 Portable underwater mass spectrometer Robert T. Short, Robert H. Byrne 2004-04-27
6670605 Method and apparatus for the down-hole characterization of formation fluids Bruce H. Storm, Jr. 2003-12-30
6633233 Acceleration rate meter 2003-10-14
6544698 Maskless 2-D and 3-D pattern generation photolithography 2003-04-08
6262691 Antenna mounting assembly with installation tool Neal D. Austin, Raymond R. Blasing 2001-07-17
5872824 Method for studying a sample of material using a heavy ion induced mass spectrometer source James F. Browning 1999-02-16
5784424 System for studying a sample of material using a heavy ion induced mass spectrometer source James F. Browning 1998-07-21