Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11687109 | Self-test for low dropout regulator measurement | Anurag Tulsiram | 2023-06-27 |
| 11285307 | Drug delivery integrated circuit (IC) and system | Byul Hur, John Hardy, Christine E. Schmidt | 2022-03-29 |
| 10588306 | Wireless smart mosquito and insect trap device, network and method of counting a population of the mosquitoes or insects | Byul Hur | 2020-03-17 |
| 9557224 | Monitoring system for perishable or temperature-sensitive product transportation and storage | Adam KINSEY | 2017-01-31 |
| 8704575 | Tunable active directional couplers | Byul Hur | 2014-04-22 |
| 7952408 | Embedded phase noise measurement system | Jae-Shin Kim | 2011-05-31 |
| 7924025 | System, device, and method for embedded S-parameter measurement | Robert Fox, Jang Sup Yoon | 2011-04-12 |
| 7925229 | Power detector of embedded IC test circuits | Robert Fox, Jang Sup Yoon, Tao Zhang | 2011-04-12 |
| 7873884 | Wireless embedded test signal generation | Qizhang Yin | 2011-01-18 |
| 7839137 | Distributed RF/microwave power detector | Jongshick Ahn, Robert Fox | 2010-11-23 |
| 7756663 | Self-calibration systems and methods | Dong Hoon Han, Abhijit Chatterjee, Selim Sermet Akbay, Soumendu Bhattacharya | 2010-07-13 |
| 7737789 | Broadband active balun | Kooho Jung, Robert Fox | 2010-06-15 |
| 7379716 | Embedded IC test circuits and methods | Robert Fox, Jang Sup Yoon, Tao Zhang | 2008-05-27 |
| 5793213 | Method and apparatus for calibrating a network analyzer | David E. Bockelman | 1998-08-11 |
| 5561378 | Circuit probe for measuring a differential circuit | David E. Bockelman | 1996-10-01 |
| 5501877 | Patterned deposition of thin films | James H. Adair, Rajiv Singh, Sherry S. Staehle | 1996-03-26 |
| 5495173 | Method and apparatus for characterizing a differential circuit | David E. Bockelman | 1996-02-27 |
| 5440130 | X-ray imaging system and solid state detector therefor | John D. Cox, Robert Fox | 1995-08-08 |
| 5220170 | X-ray imaging system and solid state detector therefor | John D. Cox, Robert Fox | 1993-06-15 |