YH

Young Myoun Han

UN Unitest: 2 patents #7 of 30Top 25%
Overall (All Time): #1,978,030 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9613718 Detection system for detecting fail block using logic block address and data buffer address in a storage tester — 2017-04-04
9378846 Non-mounted storage test device based on FPGA — 2016-06-28