Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
JK

Jong Koo Kang — 11 Patents

UNUnitest: 6 patents #1 of 30Top 4%
ELEnzychem Lifesciences: 3 patents #10 of 39Top 30%
Sosu-myeon, KR: #38 of 561 inventorsTop 7%
Overall (All Time): #435,149 of 4,157,543Top 15%
11 Patents All Time
Jong Koo Kang has been granted 11 US patents while listed as an inventor at Unitest. The first was granted in 2007 and the most recent in November 2025. Jong Koo Kang ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Jong Koo Kang in Sosu-myeon, KR.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
12473624 System and method for applying high temperature corrosion resistant amorphous based coatings Evelina Vogli, Ricardo Salas 2025-11-18
12102612 Pharmaceutical composition comprising hydroquinone derivative for preventing or treating obesity or nonalcoholic steatohepatitis Suk Mo KANG, Heung Mo Bae 2024-10-01
10857119 Composition containing monoacetyldiacylglycerol compound as active ingredient for inhibiting blood cancer or metastasis Jae Wha Kim, Sei Ryang Oh, Kyung Seop Ahn, Ho Bum Kang, Jae Min Shin +5 more 2020-12-08
10058527 Composition containing monoacetyldiacylglycerol compound as active ingredient for inhibiting blood cancer or metastasis Jae Wha Kim, Sei Ryang Oh, Kyung Seop Ahn, Ho Bum Kang, Jae Min Shin +5 more 2018-08-28
9895337 Compositions containing monoacetyldiacylglycerol compound as an active ingredient for preventing or treating rheumatoid arthritis Jae Wha Kim, Sei Ryang Oh, Kyung Seop Ahn, Ho Bum Kang, Beom Su PARK +3 more 2018-02-20
7872488 Tester for testing semiconductor device 2011-01-18
7739572 Tester for testing semiconductor device 2010-06-15
7656178 Method for calibrating semiconductor device tester 2010-02-02
7607056 Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices Sun Whan Kim 2009-10-20
7327151 Memory application tester having vertically-mounted motherboard 2008-02-05
7302623 Algorithm pattern generator for testing a memory device and memory tester using the same 2007-11-27