Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5379109 | Method and apparatus for non-destructively measuring local resistivity of semiconductors | D. Kurt Gaskill, Alok K. Berry | 1995-01-03 |
| 5365334 | Micro photoreflectance semiconductor wafer analyzer | — | 1994-11-15 |
| 4953983 | Non-destructively measuring local carrier concentration and gap energy in a semiconductor | D. Kurt Gaskill, Robert Glosser | 1990-09-04 |
| 4524090 | Deposition of compounds from multi-component organo-metals | Robert W. Schwartz, Wayne E. Thun | 1985-06-18 |
| 4508590 | Method for the deposition of high-quality crystal epitaxial films of iron | Raphael Kaplan | 1985-04-02 |
| 4492434 | Multi-color tunable semiconductor device | Howard Lessoff, Marian E. Hills | 1985-01-08 |
| 4454835 | Internal photolysis reactor | Peter J. Walsh | 1984-06-19 |
| 4403397 | Method of making avalanche photodiodes | Marian E. Hills | 1983-09-13 |
| 4350413 | Multi-color tunable filter | Howard Lessoff | 1982-09-21 |
| 4316206 | Two color narrow bandwidth detector | Marian E. Hills | 1982-02-16 |
| 4218143 | Lattice matching measurement device | — | 1980-08-19 |