Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5171399 | Reflection mass spectrometry technique for monitoring and controlling composition during molecular beam epitaxy | Thomas M. Brennan, Jeffrey Y. Tsao | 1992-12-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5171399 | Reflection mass spectrometry technique for monitoring and controlling composition during molecular beam epitaxy | Thomas M. Brennan, Jeffrey Y. Tsao | 1992-12-15 |