Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7076707 | Methodology of locating faults of scan chains in logic integrated circuits | Chin-pin Jen, Ming-Chang Yang, Hung-Chieh Chen | 2006-07-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7076707 | Methodology of locating faults of scan chains in logic integrated circuits | Chin-pin Jen, Ming-Chang Yang, Hung-Chieh Chen | 2006-07-11 |