| 7139949 |
Test apparatus to facilitate building and testing complex computer products with contract manufacturers without proprietary information |
Mark W. Jennion, William K. Shramko |
2006-11-21 |
| 6941243 |
Using conversion of high level descriptive hardware language into low level testing language format for building and testing complex computer products with contract manufacturers without proprietary information |
Mark W. Jennion, William K. Shramko |
2005-09-06 |
| 6882950 |
Building and testing complex computer products with contract manufacturers without supplying proprietary information |
Mark W. Jennion, William K. Shramko |
2005-04-19 |
| 5475815 |
Built-in-self-test scheme for testing multiple memory elements |
Larry L. Byers, Aaron C. Peterson, Joseph G. Kriscunas, Jeff Engel |
1995-12-12 |
| 5471482 |
VLSI embedded RAM test |
Larry L. Byers, Donald W. Mackenthun, Philip J. Fye, Jeff Engel, Ferris T. Price, deceased +1 more |
1995-11-28 |