Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
CG

Christopher Green — 8 Patents

UAUnder Armour: 7 patents #44 of 326Top 15%
Austin, TX: #3,968 of 18,064 inventorsTop 25%
Texas: #19,067 of 125,132 inventorsTop 20%
Overall (All Time): #600,572 of 4,157,543Top 15%
8 Patents All Time
Christopher Green has been granted 8 US patents while listed as an inventor at Under Armour. The first was granted in 2002 and the most recent in January 2023. Christopher Green ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Christopher Green in Austin, TX, US.

Patents per Year

Patents granted per year, 2002 to 2023Bar chart with a peak of 2 patents in 2017.peak 22002: 1 patents20022017: 2 patents20172018: 1 patents20182019: 1 patents20192020: 1 patents20202021: 1 patents20212023: 1 patents2023

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
11564439 System and method for determining foot strike pattern Michael Mazzoleni, F. Grant Kovach, Jeffrey Allen 2023-01-31
10890469 Methods and apparatus for determining, recommending, and applying a calibration parameter for activity measurement Abhi Bhatt, Eric Boam, Evan Torchin, Daniel Sargeant, Mayank Arora +4 more 2021-01-12
10687564 System and method for apparel identification Daniel Sargeant, F. Grant Kovach, Gamir Shrestha, John Martin 2020-06-23
10302469 Method and apparatus for determining, recommending, and applying a calibration parameter for activity measurement Abhi Bhatt, Eric Boam, Evan Torchin, Daniel Sargeant, Mayank Arora +4 more 2019-05-28
D834587 Display screen with graphical user interface Evan Torchin, Abhi Bhatt, Eric Boam, Daniel Sargeant, John Martin +3 more 2018-11-27
D790561 Display screen with graphical user interface Evan Torchin, Abhi Bhatt, Eric Boam, Daniel Sargeant, John Martin +3 more 2017-06-27
D788130 Display screen with animated graphical user interface Evan Torchin, Abhi Bhatt, Eric Boam, Daniel Sargeant, John Martin +3 more 2017-05-30
6472885 Method and apparatus for measuring and characterizing the frequency dependent electrical properties of dielectric materials Jeffrey Max Seligman 2002-10-29