BG

Bennett B. Goldberg

BU Boston University: 11 patents #23 of 1,102Top 3%
AS Aramco Services: 1 patents #15 of 61Top 25%
Saudi Arabian Oil: 1 patents #2,080 of 4,275Top 50%
UF US Air Force: 1 patents #6,190 of 16,312Top 40%
📍 Newton, MA: #494 of 2,747 inventorsTop 20%
🗺 Massachusetts: #10,511 of 88,656 inventorsTop 15%
Overall (All Time): #409,291 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
11275030 Structured substrates for optical surface profiling M. Selim Ünlü, David A. Bergstein, Michael Ruane 2022-03-15
10705138 Optical antennas for advanced integrated circuit testing M. Selim Ünlü, Yusuf Leblebici 2020-07-07
10564107 Structured substrates for optical surface profiling M. Selim Ünlü, David A. Bergstein, Michael Ruane 2020-02-18
10282833 Gate-level mapping of integrated circuits using multi-spectral imaging Ronen Adato, Ajay Joshi, M. Selim Ünlü 2019-05-07
10175476 Solid immersion microscopy system with deformable mirror for correction of aberrations Thomas Bifano, Selim M. Unlu, Euan Ramsay, Fatih Hakan Koklu, Jerome Mertz +3 more 2019-01-08
10018817 Adaptive optics for imaging through highly scattering media in oil reservoir applications Thomas Bifano, Shannon L. Eichmann, Mazen Y. Kanj, Hari P. Paudel, William Shain 2018-07-10
9983260 Dual-phase interferometry for charge modulation mapping in ICS Abdulkadir Yurt, Selim M. Unlu, Euan Ramsay 2018-05-29
9599611 Structured substrates for optical surface profiling M. Selim Ünlü, David A. Bergstein, Michael Ruane 2017-03-21
7695680 Resonant cavity biosensor M. Selim Ünlü, David A. Bergstein, Michael Ruane 2010-04-13
7110118 Spectral imaging for vertical sectioning Selim M. Unlu, Anna Swan, Stephen Bradley Ippolito, Lev Moiseev, Samuel Lipolf +1 more 2006-09-19
6687058 Numerical aperature increasing lens (nail) techniques for high-resolution sub-surface imaging Stephen Bradley Ippolito, M. Selim Ünlü 2004-02-03
5548113 Co-axial detection and illumination with shear force dithering in a near-field scanning optical microscope Hadi F. Ghaemi 1996-08-20