Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332352 | Detector for identifying at least one material property | Friedrich SCHICK, Peter Schillen, Patrick Schindler, Andre Schmidt, Michael Eberspach +6 more | 2025-06-17 |
| 12298394 | Detector for identifying at least one material property | Friedrich SCHICK, Peter Schillen, Patrick Schindler, Andre Schmidt, Michael Eberspach +6 more | 2025-05-13 |
| 12087003 | Auto calibration from epipolar line distance in projection pattern | Patrick Schindler, Friedrich SCHICK, Christian LENNARTZ, Peter Schillen | 2024-09-10 |
| 11947013 | Detector for identifying at least one material property | Friedrich SCHICK, Peter Schillen, Patrick Schindler, Andre Schmidt, Michael Eberspach +6 more | 2024-04-02 |
| 11906421 | Enhanced material detection by stereo beam profile analysis | Patrick Schindler, Ruben HUEHNERBEIN, Christian LENNARTZ | 2024-02-20 |