Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994454 | Particle beam experiment data analysis device | Akinori Asahara, Hidekazu MORITA, Takuya Kanazawa, Masao Yano, Tetsuya Shoji | 2024-05-28 |
| 9835569 | Magnetic measurement system and apparatus utilizing X-ray to measure comparatively thick magnetic materials | Masao Yano | 2017-12-05 |
| 9766190 | Method, system and apparatus for measuring comparatively thick materials | Masao Yano | 2017-09-19 |