Issued Patents All Time
Showing 1–25 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12002853 | Semiconductor device | Tsutomu INA | 2024-06-04 |
| 11069788 | Semiconductor device | Noriaki Murakami | 2021-07-20 |
| 11011607 | Method of manufacturing semiconductor device | Kota Yasunishi, Kazuya Hasegawa | 2021-05-18 |
| 10854454 | Semiconductor device and method for manufacturing the same | Yukihisa Ueno, Nariaki Tanaka, Junya Nishii | 2020-12-01 |
| 10832911 | Semiconductor device | Nariaki Tanaka, Yukihisa Ueno, Kota Yasunishi | 2020-11-10 |
| 10777674 | Semiconductor device | Takaki Niwa | 2020-09-15 |
| 10074728 | Semiconductor device | Takahiro Sonoyama | 2018-09-11 |
| 9620608 | Semiconductor device and manufacturing method thereof | Noriaki Murakami | 2017-04-11 |
| 9508822 | Semiconductor device | Takahiro Sonoyama | 2016-11-29 |
| 9443950 | Semiconductor device | Nariaki Tanaka | 2016-09-13 |
| 9437525 | Semiconductor device and manufacturing method thereof | Noriaki Murakami | 2016-09-06 |
| 9391150 | Semiconductor Device | Nariaki Tanaka | 2016-07-12 |
| 9356140 | Semiconductor device | Yukihisa Ueno | 2016-05-31 |
| 9349668 | Semiconductor device | Yukihisa Ueno, Kazuya Hasegawa | 2016-05-24 |
| 9349856 | Semiconductor device including first interface and second interface as an upper surface of a convex protruded from first interface and manufacturing device thereof | — | 2016-05-24 |
| 9335380 | Device for detecting insulation degradation | Yoshimasa Watanabe, Ryuichi Nishiura, Yoshiharu Kaneda, Hiroshi Nishizawa, Hirotaka Muto +2 more | 2016-05-10 |
| 9331157 | Semiconductor device | Nariaki Tanaka | 2016-05-03 |
| 9299567 | Manufacturing method of MIS-type semiconductor device, including heating a zirconium oxynitride (ZrON) layer | Kiyotaka Mizukami, Takahiro Sonoyama, Junya Nishii | 2016-03-29 |
| 9136367 | Semiconductor device | Yukihisa Ueno, Kazuya Hasegawa | 2015-09-15 |
| 9123635 | Manufacturing method of semiconductor device | Nariaki Tanaka | 2015-09-01 |
| 9030210 | Insulation deterioration diagnosis apparatus | Yoshimasa Watanabe, Yoshiharu Kaneda, Hiroshi Nishizawa | 2015-05-12 |
| 8987077 | Group III nitride semiconductor device, production method therefor, and power converter | — | 2015-03-24 |
| 8633519 | Group III nitride semiconductor device, production method therefor, power converter | — | 2014-01-21 |
| 7589314 | Optical encoder applying substantially parallel light beams and three periodic optical elements | Yoichi Ohmura | 2009-09-15 |
| 7566307 | Blood pressure monitoring apparatus | Hidekatsu Inukai | 2009-07-28 |