Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11268857 | Spectrum analysis method and spectrum analysis apparatus | Tetsuya Nakamura | 2022-03-08 |
| 11175327 | Radiated emission measurement method and radiated emission measurement system | Tetsuya Nakamura | 2021-11-16 |