Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11158395 | Reliability evaluation apparatus | Hiroaki Maekawa | 2021-10-26 |
| 10593375 | Semiconductor memory device with correcting resistances in series with memory array signal lines | — | 2020-03-17 |