Issued Patents All Time
Showing 51–71 of 71 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7877334 | Recognizing apparatus and recognizing method | Takumi Kobayashi | 2011-01-25 |
| 7826298 | Semiconductor memory device with low standby current | Hirotoshi Sato, Kiyoyasu Akai | 2010-11-02 |
| 7653662 | Method and system for data processing with data distribution managing | Hitoshi Mizutani, Atsushi Hirata | 2010-01-26 |
| 7321839 | Method and apparatus for calibration of camera system, and method of manufacturing camera system | Kenichi Maeda, Yasuhiro Taniguchi, Susumu Kubota | 2008-01-22 |
| 7313265 | Stereo calibration apparatus and stereo image monitoring apparatus using the same | Masayuki Maruyama, Duangmanee Putthividhya | 2007-12-25 |
| 7209031 | Obstacle detecting apparatus and method | Nobuyuki Takeda, Hiroshi Hattori, Kazunori Onoguchi | 2007-04-24 |
| 7132933 | Obstacle detection device and method therefor | Hiroshi Hattori, Nobuyuki Takeda, Kazunori Onoguchi | 2006-11-07 |
| 7124046 | Method and apparatus for calibration of camera system, and method of manufacturing camera system | Kenichi Maeda, Yasuhiro Taniguchi, Susumu Kubota | 2006-10-17 |
| 7106129 | Semiconductor device less susceptible to variation in threshold voltage | — | 2006-09-12 |
| 7091837 | Obstacle detecting apparatus and method | Nobuyuki Takeda, Hiroshi Hattori, Kazunori Onoguchi | 2006-08-15 |
| 6906620 | Obstacle detection device and method therefor | Hiroshi Hattori, Nobuyuki Takeda, Kazunori Onoguchi | 2005-06-14 |
| 6771117 | Semiconductor device less susceptible to variation in threshold voltage | — | 2004-08-03 |
| 6549480 | Semiconductor integrated circuit allowing internal voltage to be measured and controlled externally | Akira Hosogane, Yoshitsugu Dohi, Tatsuya Saeki | 2003-04-15 |
| 6529418 | Non-volatile semiconductor memory device conducting data write and erase operations based on a prescribed unit region | Satoshi Tatsukawa, Kei Maejima | 2003-03-04 |
| 6335882 | Nonvolatile semiconductor memory device capable of erasing blocks despite variation in erasing characteristic of sectors | Tatsuya Saeki | 2002-01-01 |
| 6110123 | Region-of-interest setting apparatus for respiration monitoring and a respiration monitoring system | Ken Ishihara, Yoshio Miyake, Mutsumi Watanabe, Keisuke Takada | 2000-08-29 |
| 6069518 | Semiconductor device allowing generation of desired internal voltage at high accuracy | Shinichi Kobayashi, Motoharu Ishii, Atsushi Ohba, Tomoshi Futatsuya, Akira Hosogane | 2000-05-30 |
| 6067164 | Method and apparatus for automatic adjustment of electron optics system and astigmatism correction in electron optics device | Kazunori Onoguchi | 2000-05-23 |
| 5917354 | Circuit for resetting output of positive/negative high voltage generating circuit to VCC/VSS | Shinichi Kobayashi, Masaaki Mihara | 1999-06-29 |
| 5521864 | Non-volatile semiconductor memory device allowing fast verifying operation | Shinichi Kobayashi, Motoharu Ishii, Atsushi Ohba, Tomoshi Futatsuya, Akira Hosogane | 1996-05-28 |
| 5243418 | Display monitoring system for detecting and tracking an intruder in a monitor area | Yoshinori Kuno, Kazuhiro Fukui | 1993-09-07 |