Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5940173 | Method and apparatus for inspecting the quality of transparent protective overlays | Syuzo Tomii, Kunio Omura, Michio Shinozaki, Ken Yokoyama | 1999-08-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5940173 | Method and apparatus for inspecting the quality of transparent protective overlays | Syuzo Tomii, Kunio Omura, Michio Shinozaki, Ken Yokoyama | 1999-08-17 |