Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5337045 | Pattern generator | — | 1994-08-09 |
| 5337318 | Memory IC testing apparatus with redundancy circuit | Hisao Tsukakoshi | 1994-08-09 |
| 4450538 | Address accessed memory device having parallel to serial conversion | — | 1984-05-22 |
| 4312067 | Function test evaluation apparatus for evaluating a function test of a logic circuit | — | 1982-01-19 |
| 4287594 | Function test evaluation apparatus for evaluating a function test of a logical circuit | — | 1981-09-01 |