YK

Yuzo Katsuki

TC Tokyo Seimitsu Co.: 1 patents #110 of 257Top 45%
Overall (All Time): #3,443,675 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6867424 Wafer defect inspection machine having a dual illumination system Toshirou Kurosawa, Jun Takebayashi 2005-03-15