NH

Natsumi Hayashi

TC Tokyo Seimitsu Co.: 1 patents #110 of 257Top 45%
📍 Tsuchiura, JP: #340 of 519 inventorsTop 70%
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Patent #TitleCo-InventorsDate
11940463 Particle measurement device, three-dimensional shape measurement device, prober device, particle measurement system, and particle measurement method Hideki Morii, Tetsuo Yoshida, Toshiyuki Kimura 2024-03-26