Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9519022 | Method for pre-heating probe card | Hiroshi Yamada, Takaaki Hoshino, Shinji Kojima, Hiroshi Shimoyama | 2016-12-13 |
| 9201115 | Wafer inspection apparatus | Hiroshi Yamada, Takaaki Hoshino, Shinji Kojima, Hiroshi Shimoyama | 2015-12-01 |